University of Bahrain
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Efficient CRNN Recognition Approaches for Defective Characters in Images

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dc.contributor.author Al-Nabhi, Hashem
dc.contributor.author Krishna, K.Lokesh
dc.contributor.author Shareef, d Ahmed Abdullah A.
dc.date.accessioned 2022-12-06T20:38:51Z
dc.date.available 2022-12-06T20:38:51Z
dc.date.issued 2022-12-06
dc.identifier.issn 2210-142X
dc.identifier.uri https://journal.uob.edu.bh:443/handle/123456789/4705
dc.description.abstract Defective Characters exist frequently and broadly in images such as license plates, electricity, water meters, street boards, etc. Thus, building robust recognition systems or enhancing the accuracy and robustness of the existing recognition systems to recognize such characters on images is a challenging research topic in image processing and computer vision. This paper Investigates and adopts ReId dataset for all the experimental work and introduces two deep learning models (CNN5-BLSTM and CNN7-GRU) based on convolutional recurrent neural networks (CRNN) to address the problem of defective characters sequence recognition. The two proposed deep learning models are segmentation-free, lightweight, End-To-End trainable, and slightly different from each other. The models are evaluated on testing data of ReId dataset, and the achieved accuracies are 95% of characters’ sequence accuracy and 98% of character-level accuracy. Moreover, their performance on ReId dataset outperforms other models’ performance in the literature. en_US
dc.language.iso en en_US
dc.publisher University of Bahrain en_US
dc.subject Deep Learning, Image Processing, Characters Sequence recognition, Defective Characters, Convolutional Recurrent Neural Networks, Convolution Neural Networks, Connectionist Temporal Classification, Gated Recurrent Unit, Long Short-Term Memory. en_US
dc.title Efficient CRNN Recognition Approaches for Defective Characters in Images en_US
dc.type Article en_US
dc.identifier.doi https://dx.doi.org/10.12785/ijcds/1201114
dc.volume 12 en_US
dc.issue 1 en_US
dc.pagestart 1417 en_US
dc.pageend 1427 en_US
dc.contributor.authoraffiliation Department of Electronics and Information, Northwestern Polytechnical University, Xian City, China en_US
dc.contributor.authoraffiliation Department of ECE, S.V. College of Engineering, Tirupathi, A.P., India en_US
dc.contributor.authoraffiliation Department of Computer Science and IT, Dr. Babasaheb Ambedkar Marathwada University, Aurangabad, India en_US
dc.source.title International Journal of Computing and Digital Systems en_US
dc.abbreviatedsourcetitle IJCDS en_US


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