University of Bahrain
Scientific Journals

Browsing Issue 01 by Author "School of Electronics and Electrical Engineering, Lovely Professional University, Phagwara"

Browsing Issue 01 by Author "School of Electronics and Electrical Engineering, Lovely Professional University, Phagwara"

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  • Kumar, Abhishek (2021-08-19)
    Aggressive integrated circuits dimension scaling while the supply voltage is not proportionally scaled leads to reliability degradation. Hot carrier injection (HCI) and negative bias temperature instability (NBTI) effect ...

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