University of Bahrain
Scientific Journals

Browsing Volume 12 by Subject "NBTI"

Browsing Volume 12 by Subject "NBTI"

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  • Kumar, Abhishek (2021-08-19)
    Aggressive integrated circuits dimension scaling while the supply voltage is not proportionally scaled leads to reliability degradation. Hot carrier injection (HCI) and negative bias temperature instability (NBTI) effect ...

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