Finite Element Approach of Unshielded Multiconductor Transmission Lines Embedded in Layered Dielectric Region for VLSI Circuits

Abstract

This paper presents the quasi-TEM approach for the analysis of unshielded multiconductor transmission lines interconnect in single and two-layered dielectric region using the finite element method (FEM). We mainly focus on designing of four-transmission lines embedded in two-layered dielectric media and five-transmission lines interconnect in single-layered dielectric medium. We compute the capacitance matrices for these configurations. Also, we determine the quasi-TEM spectral for the potential distribution of the integrated circuits.