dc.contributor.author |
Kumar, Deepak |
|
dc.contributor.author |
Kukreja, Vinay |
|
dc.date.accessioned |
2023-03-02T12:22:03Z |
|
dc.date.available |
2023-03-02T12:22:03Z |
|
dc.date.issued |
2023-03-02 |
|
dc.identifier.issn |
2210-142X |
|
dc.identifier.uri |
https://journal.uob.edu.bh:443/handle/123456789/4788 |
|
dc.description.abstract |
Experienced evaluators takes a lot of time for the correct prediction of wheat yellow rust. For better prediction of wheat
yellow rust disease in wheat plant, computer assisted techniques such as machine learning (ML), deep learning (DL), image processing
and computer vision techniques are employed. While considering these aspects, an automatic classification system for wheat yellow
rust using a hybrid approach of a generative adversarial network (GAN) and convolutional neural network (CNN) is proposed. Also, the
proposed model helps to identify wheat yellow rust disease at different severity levels (very low, low, medium, high, and very high). For
achieving objectives about proposed model, State of Art GAN (STARGAN) helps in data augmentation of wheat plant disease images.
Finally, a wheat rust model based on convolutional networks was trained on generated data. A case study has also been accomplished
on the generated data by deploying a CNN model for classification. Then a comparative analysis of the proposed methodology has been
consummated by differentiating the performance metric with the fully convolutional network, deep CNN (DCNN) and random forest
models. A Deep CNN is a CNN model with a huge number of hidden layers. Comparing the proposed approach with other models,
the proposed approach achieves a greater classification accuracy of 95.6% at a medium severity level. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
University of Bahrain |
en_US |
dc.subject |
Wheat, Agriculture, Crop, Convolutional Neural Networks, Generative Adversarial Networks, Precision, Productivity |
en_US |
dc.title |
Combined CNN with STARGAN for Wheat Yellow Rust Disease Classification |
en_US |
dc.type |
Article |
en_US |
dc.identifier.doi |
http://dx.doi.org/10.12785/ijcds/130187 |
|
dc.contributor.authoraffiliation |
Chitkara University Institute of Engineering and Technology, Chitkara University, Punjab, India. |
en_US |
dc.source.title |
International Journal of Computing and Digital Systems |
en_US |
dc.abbreviatedsourcetitle |
IJCDS |
en_US |